This New Technology May Get You Through Airport Security Faster

Name: This New Technology May Get You Through Airport Security Faster
Uploaded: 2018-07-23T21:46:09+00:00
Duration: 56 s
Channel: Veuer
Description: American Airlines and TSA are testing a new 3-D CT scanner to screen luggage at JFK Airport in New York.

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American Airlines and TSA are testing a new 3-D CT scanner to screen luggage at JFK Airport in New York.

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